The market for RF enabled devices is increasing rapidly, and they are finding their way into a diverse range of products and market segments ranging from to very low volume to very high volume. This increase is driven by the popularity of WIFI, Bluetooth and ZigBee communication standards, among others, which now can be implemented very costeffectively with either SOC or module based solutions.
Functional testing of these RF devices is often thought to be an extremely complex and expensive task. RF enabled
devices are often either inadequately or excessively tested due to a lack of understanding of what actually needs to be tested, and how it can be tested.
Eiger Design has written a document that briefly highlights some of the considerations and solutions available to test engineers to help them achieve the best test solution, in terms of cost and complexity, when dealing with RF enabled devices.
Follow the link to find out more <Testing of SOC based RF devices>
Many test applications require a fixture to provide pin contacts to the UUT. With the new J-Testr+ concept, the J-Testr can be fitted inside the fixture with little effort, providing a very neat and compact solution with minimal cables.
With rear connections and access to the interposer, external equipment can be easily accessed, in the case below an Ethernet hub is powered directly from the J-Testr 5V eliminating unnecessary and untidy cabling.
The latest version of the J-Debugr version includes:
1) Improved connection response on Windows 10
2) Register name tool tip active on 'Read' button and 'Value' spin box to assist locating correct register to read a value or make a value change
3) Minor small bug and text amendments
Please see at in <Downloads>