J-Safe protection features
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The J-Test Core and J-Testr NextGen systems have been designed with UUT protection as part of their DNA, so much so we have given it a name ‘J-Safe’.
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J-Safe safety mechanisms provides an exceptional level of protection for high value electronic devices during testing. This advanced safety feature lies at the heart of the J-Testr test system and offers much increased defense against board level faults that can remain undiscovered even after traditional in-line tests such as AOI, Xray and ICT.
Through J-Safe’s advanced safeguarding capability, time consuming activities such as fault isolation, component replacement and the associated risks of track/pad damage, that may requiring major PCB rework, are all minimized, ultimately saving production time and other costs.
Through J-Safe’s advanced safeguarding capability, time consuming activities such as fault isolation, component replacement and the associated risks of track/pad damage, that may requiring major PCB rework, are all minimized, ultimately saving production time and other costs.
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Electronic protection features
All J-Test Core fault monitoring circuits are connected to “J-Safe” circuit which, upon any trigger, will rapidly put the whole test system into a predefined safe state. With all power and stimulation sources isolated, from the UUT, the potential for component level damage caused by over voltage (OV), over current (OC) or any other protection source is significantly reduced. Click here for more detailed information. |
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echanical protection features (NextGen Systems)
To further protect the UUT the J-Testr NextGen Systems provide protection against mechanical events that could damage the UUT or the test system itself as detailed below:
Fixture open detection
A sensor on the fixture opening triggers an immediate system ‘reset’ condition disconnection all external power sources to protect the test system and rapidly place the test system into a predefined safe state to protect the UUT.
Fixture Clam open detection
A programmable sensor on the clam shell opening triggers an immediate system ‘J-Safe’ condition rapidly placing the test system into a predefined safe state to protect the UUT.
Exchangeable Safety lock:
A programmable solenoid locks the exchangeable to stop it being removed when in use and if any direct wired cables are still plugged.
To further protect the UUT the J-Testr NextGen Systems provide protection against mechanical events that could damage the UUT or the test system itself as detailed below:
Fixture open detection
A sensor on the fixture opening triggers an immediate system ‘reset’ condition disconnection all external power sources to protect the test system and rapidly place the test system into a predefined safe state to protect the UUT.
Fixture Clam open detection
A programmable sensor on the clam shell opening triggers an immediate system ‘J-Safe’ condition rapidly placing the test system into a predefined safe state to protect the UUT.
Exchangeable Safety lock:
A programmable solenoid locks the exchangeable to stop it being removed when in use and if any direct wired cables are still plugged.
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Clear Indication
The J-Testr Core provides latched bits for all J-Safe features and also a simple mechanism to clearly define the peripheral card, or motherboard, that caused the trigger. This enables the software to easily and quickly identify the fault to report back to the user. Outputs are available to indicate a J-Safe has occurred. J-Testr NextGen systems provide a visual LED indicator on the front panel such to inform the user a J-Safe protection trigger has occurred. |
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