Ready To Use Test Solution
Features• Ready to test with no customisation
• Compact space-saving footprint • Highly configurable and versatile • Unique ‘Prototype Exchangeable Unit’ option • Integrated oscilloscope & RF measurement options • Flexible choice of test software language • Includes J-Safe rapid UUT protection |
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The J-Testr+ GTI test system is a complete functional circuit test system in a compact, ready to use desktop format. Measuring 465mm x 500mm in standard form and with all Unit Under Test (UUT) surfaces ESD safe it can fit into any production process. The J-Testr+ GTI utilises a unique system of Exchangeable Units , making it a test solution configurable for all levels of volume from prototype to full production.
The J-Testr+ GTI includes options such as ; RF and integrated oscilloscope , LED analyser, high speed programming and JTAG and as standard incorporates J-Safe our advanced defence against board level faults offering a system-wide protection scheme.
The J-Testr+ GTI includes options such as ; RF and integrated oscilloscope , LED analyser, high speed programming and JTAG and as standard incorporates J-Safe our advanced defence against board level faults offering a system-wide protection scheme.
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GTI - Test Straight Out Of The Box
With the Generic Test Interposer (GTI) the system is ready to use with no customisation required. All stimulation and measurement signals are readily available whether automatically plugging with a mass inter-connect system (e.g. Pylon) or direct plugging with standard pitch ribbon cable. Both Ethernet and native JTAG communication interfaces are supported and the simple register based software interface allows users to choose their own test software environment and operating system. |
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Exchangeable Unit For Easy & Rapid Changeover
The connector pin-outs on the Exchangeable Units are identical for low cost direct plugging or mass inter-connect options, allowing simple transition between interface types. All Exchangable Units use standard pin and pitch interfaces supporting all stimulation and measurement signal types, keeping connection types the same and allowing the use of standard cables. Flexible ‘Pass-Thru’ wiring enables easy routing of low or high speed signals between the UUT and additional equipment, internal or external to the J-Testr+ GTI system. |
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Prototype Test Made Simple
A unique ‘Prototype Exchangeable Unit’ allows the test system to be used immediately upon receiving the first/prototype UUT with NO tooling. This allows test developers, or even R+D teams, to utilise the test system from a very early stage in the product development cycle. Test development and design verification can be done before committing to ‘Bed of Nails’ tooling, allowing developed test code/circuitry to be easily reused and passed forward to the final production test, saving significant time and resource. Using our J-Mount, the UUT can be held securely with quick and easy insertion, lock and release, without damage to components or solder joints. |
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Expandable And Versatile
J-Testr Peripheral Cards add modular measurement and/or stimulation functions to the J-Testr system. The ‘peripheral’ name is used to reflect the simple microcontroller-like ‘register-based’ control mechanism of the J-Testr. I.e. Similar to the peripherals incorporated in most modern micro-controllers.
Connection from the Exchangeable Unit to the pins, and on to the UUT, can be achieved using our ‘EZ-Wired’ concept with a custom Connection Card, or with more traditional wire wrap, or even direct soldered wires. These options provide complete flexibility for all UUT types and complexity.
Multiple expansion options are possible via internal ports, ‘Pass-Thru’ wiring and a system expansion area. Options for integrated oscilloscopes, RF power/frequency meters and RF signal generators can be added. These features give the J-Testr+ GTI test system advanced signal measurement capabilities for testing the latest Internet of Things (IOT) devices.
In addition, third party equipment such as LED analysers, JTAG boundary scan systems and high speed programmers are easily integrated internally to match UUT testing requirements.
As the J-Testr+ GTI test system utilises the J-Testr+ Midi fixture, it includes all the mechanical customisation features that are offered by this product. This includes a simple customisable front panel, VESA PC mounting, cable access slot/holes and rear mounts.
J-Testr Peripheral Cards add modular measurement and/or stimulation functions to the J-Testr system. The ‘peripheral’ name is used to reflect the simple microcontroller-like ‘register-based’ control mechanism of the J-Testr. I.e. Similar to the peripherals incorporated in most modern micro-controllers.
Connection from the Exchangeable Unit to the pins, and on to the UUT, can be achieved using our ‘EZ-Wired’ concept with a custom Connection Card, or with more traditional wire wrap, or even direct soldered wires. These options provide complete flexibility for all UUT types and complexity.
Multiple expansion options are possible via internal ports, ‘Pass-Thru’ wiring and a system expansion area. Options for integrated oscilloscopes, RF power/frequency meters and RF signal generators can be added. These features give the J-Testr+ GTI test system advanced signal measurement capabilities for testing the latest Internet of Things (IOT) devices.
In addition, third party equipment such as LED analysers, JTAG boundary scan systems and high speed programmers are easily integrated internally to match UUT testing requirements.
As the J-Testr+ GTI test system utilises the J-Testr+ Midi fixture, it includes all the mechanical customisation features that are offered by this product. This includes a simple customisable front panel, VESA PC mounting, cable access slot/holes and rear mounts.
Accessories
J-Testr+ GTI 'Bed of Nails' Exchangeable Unit
J-Testr+ GTI Prototype Exchangeable Unit
J-Testr+ GTI Self-Test Exchangeable Unit
Oscilloscope Option
Ribbon Cables
Services
J-Testr GTI 'Bed of Nails' Customisation Service
| J-Testr+GTI Information Sheet.pdf |
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